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Nanoscale quantification of charge injection and transportation process in Si-nanocrystal based sandwiched structure

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Nanoscale, 2013, Accepted Manuscript
DOI: 10.1039/C3NR03306F, Paper
Jie Xu, Jun Xu, Peng Zhan Zhang, Wei Li, Kun Ji Chen
Charge injection and transportation in silicon nanocrystals are characterized by joint analysis of KPFM and CAFM quantitatively at the nanoscale.
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