Nanoscale, 2012, Accepted Manuscript
DOI: 10.1039/C2NR33214K, Paper
DOI: 10.1039/C2NR33214K, Paper
Raphael R. Gruter, Janos Voros, Tomaso Zambelli
Atomic force microscope (AFM) is a powerful instrument for nanolithography, which is well characterized in air where the deposition process is steered by capillary action. On the contrary, AFM patterning...
The content of this RSS Feed (c) The Royal Society of Chemistry
Atomic force microscope (AFM) is a powerful instrument for nanolithography, which is well characterized in air where the deposition process is steered by capillary action. On the contrary, AFM patterning...
The content of this RSS Feed (c) The Royal Society of Chemistry