Nanoscale, 2013, Advance Article
DOI: 10.1039/C2NR33603K, Communication
DOI: 10.1039/C2NR33603K, Communication
Qiong Zhang, Xinwei Deng, Peter Z. G. Qian, Xudong Wang
Novel statistical methods are developed to remove artifacts from SKPM surface potential mapping and improve the special resolution.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry
Novel statistical methods are developed to remove artifacts from SKPM surface potential mapping and improve the special resolution.
To cite this article before page numbers are assigned, use the DOI form of citation above.
The content of this RSS Feed (c) The Royal Society of Chemistry