Bond nature of active metal ions in SiO2-based electrochemical metallization memory cells

Nanoscale, 2013, 5,1781-1784
DOI: 10.1039/C3NR34148H, Communication

Deok-Yong Cho, Stefan Tappertzhofen, Rainer Waser, Ilia Valov
XAS studies on the bonding characteristics in SiO₂-based ECM cells suggested a dominating role of Cu²⁺ in resistive switching.
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